Publication Date
2020
Document Type
Dissertation/Thesis
First Advisor
Polansky, Alan M.
Degree Name
M.S. (Master of Science)
Legacy Department
Department of Statistics and Actuarial Science
Abstract
Systems, and their reliabilities, depend on the reliabilities of the components that theyare composed of, and in this paper we want to nd the system structure that is the most likely given observed data. Bayesian methods were utilized in order to discover the posterior means, or observed reliabilities, of both the components and the systems. Assuming the serial and parallel system structures have independent components, we calculated system reliabilities based on observed component reliabilities by using the multiplication and addi- tion probability rules. We are then able to expand upon the numerical comparison method through a maximum likelihood analysis that compares the computed system reliability to the observed system reliability. To account for any variation, we then simulate new data using the observed data that is passed through our maximum likelihood analysis in order to discover the most likely system structure. These functions are developed using R code; and our process is illustrated using an example dataset.
Recommended Citation
Harms, Shannon, "Bayesian Approach to Finding The Most Likely Circuit Structure" (2020). Graduate Research Theses & Dissertations. 7093.
https://huskiecommons.lib.niu.edu/allgraduate-thesesdissertations/7093
Extent
44 pages
Language
eng
Publisher
Northern Illinois University
Rights Statement
In Copyright
Rights Statement 2
NIU theses are protected by copyright. They may be viewed from Huskie Commons for any purpose, but reproduction or distribution in any format is prohibited without the written permission of the authors.
Media Type
Text
