Publication Date

1986

Document Type

Dissertation/Thesis

First Advisor

Benbow, Ralph L.

Degree Name

M.S. (Master of Science)

Department

Department of Physics

LCSH

Niobium nitride||Superconductivity||Dielectrics||Dielectric films||Thin films

Abstract

The purpose of this study is to relate the dielectric constant data of thin film samples of superconducting niobium nitride to the structural properties of the films. A rotating analyzer ellipsometer was used to measure the complex dielectric constant of four thin film samples of superconducting niobium Nitride over the 1.9 to 3.5 eV energy range. Each sample was produced by using a different growth rate, thereby also yielding different dielectric constant spectra. The corresponding structural properties of each sample were approximated by using an effective medium theory to relate the dielectric constant data to the structural properties. The superconducting transition temperature of each of the samples was measured by other researchers, thus presenting an independent measure of structural properties. It was found that the structural properties as determined optically correlated with the structural properties as determined by superconductivity measurements.

Comments

Bibliography: pages [71]-75.

Extent

75 pages

Language

eng

Publisher

Northern Illinois University

Rights Statement

In Copyright

Rights Statement 2

NIU theses are protected by copyright. They may be viewed from Huskie Commons for any purpose, but reproduction or distribution in any format is prohibited without the written permission of the authors.

Media Type

Text

Share

COinS