Publication Date

1992

Document Type

Dissertation/Thesis

First Advisor

Genis, Alan P.

Degree Name

M.S. (Master of Science)

Department

Department of Electrical Engineering

LCSH

Thick films||Electric resistors

Abstract

The feasibility of using a Nd:YAG laser to reduce the resistance of fired thick film resistors (TFRs) has been previously reported. This study presents data on temperature coefficient-of-resistance, high temperature storage, voltage coefficient-of-resistance, and noise index analysis of laser treated TFRs. The resulting data is compared to the specifications defined by the ink manufactures. In addition to the stability tests, a mathematical model will be defined for analysis of the steady state heat transfer of this laser treatment process. This model will help facilitate further studies to better understand the physical mechanisms of this laser technique.

Comments

Includes bibliographical references (pages [70]-71)

Extent

viii, 126 pages

Language

eng

Publisher

Northern Illinois University

Rights Statement

In Copyright

Rights Statement 2

NIU theses are protected by copyright. They may be viewed from Huskie Commons for any purpose, but reproduction or distribution in any format is prohibited without the written permission of the authors.

Media Type

Text

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