Carnahan, Jon W.
M.S. (Master of Science)
Department of Chemistry
Plasma spectroscopy||Emission spectroscopy
In the field of elemental analysis, there is a great demand for versatile analytical systems. Recently, microwave-induced plasma (MIP) systems have been proven to produce useable atomic emission from aqueous halogens in the visible region. Because there is a trend of improved detection limits as the power applied to the plasma is increased, a logical step is to increase the applied power far beyond the 500 W limit of initial experiments. In this work, a modified TM₀₁₀ Beenakker cavity was used to maintain a helium kilowatt-plus MIP (KiP-MIP). Instrumental considerations of the microwave focusing device, power train, plasma torch design, microwave generator, sample introduction and optical system used in these studies are presented. Operational characteristics of plasma ignition, generator output, tuning procedures and data collection are thoroughly investigated. Results of plasma energy studies, including electron density and spectroscopic temperature, are discussed in comparison to previous systems. The analytical figures of merit for this system are determined. Detection limits and calibration curves for a number of metals and nonmetals are presented. Results of gas phase and aqueous sample introduction are investigated, conclusions drawn, and directions for further research suggested.
Cull, Kevin Brian, "Development of a kilowatt-plus helium microwave-induced plasma as an analytical atomic emission source" (1988). Graduate Research Theses & Dissertations. 2165.
vii, 104 pages
Northern Illinois University
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