Document Type
Article
Media Type
Text
Abstract
Changes to the structure of polystyrene melt films as measured through the spectrum of density fluctuations have been observed as a function of film thickness down to the polymer radius of gyration (Rg). Films thicker than 4Rg show bulklike density fluctuations. Thinner films exhibit a peak in S(q) near q = 0, which grows with decreasing thickness. This peak is attributed to a decreased interpenetration of chains resulting in an enhanced compressibility. Measurements were made using small angle x-ray scattering in a standing wave geometry designed to enhance scattering from the interior of the film compared to interface scattering.
DOI
10.1103/PhysRevLett.101.115501
Publication Date
1-1-2008
Recommended Citation
Lurio, Laurence; Mukhopadhyay, M.K.; Jiao, X.; Jiang, Zhang; Stark, J.; Sprung, Michael; Narayanan, S.; Sandy, A.R.; and Sinha, S.K., "Thickness Induced Structural Changes in Polystyrene Films" (2008). Faculty Peer-Reviewed Publications. 1019.
https://huskiecommons.lib.niu.edu/allfaculty-peerpub/1019
Department
Department of Physics
Sponsorship
This work is supported by NSF Grant No. DMR-0209542. Use of the Advanced Photon Source at Argonne National Laboratory was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.
ISSN
0031-9007
Language
eng
Publisher
American Physical Society
